stdClass Object
(
    [id] => 18390
    [paper_index] => 202512-01-025242
    [title] => DYNAMIC CONTACT RESISTANCE MEASUREMENT RESISTANCE FOR CIRCUIT BREAKERS
    [description] => 
    [author] => Pradeep, Petchiammal, Stebin
    [googlescholar] => 
    [doi] => 
    [year] => 2025
    [month] => December
    [volume] => 11
    [issue] => 12
    [file] => fm/jpanel/upload/2025/December/202512-01-025242.pdf
    [abstract] => Dynamic Contact Resistance Measurement (DCRM) is a vital diagnostic technique for assessing the health of Extra High Voltage (EHV) circuit breakers by capturing resistance variations during contact movement. This paper presents an AI-based framework that automates DCRM analysis to accurately detect abnormalities in arcing contacts, main contacts, and operating mechanisms. The system uses machine-learning models to interpret resistance signatures, classify fault patterns, and predict emerging failures before they lead to outages. By integrating historical data, real-time measurements, and intelligent pattern recognition, the proposed approach enhances reliability, reduces maintenance downtime, and enables condition-based monitoring of circuit breakers.
    [keywords] => 
    [doj] => 2025-12-13
    [hit] => 
    [status] => 
    [award_status] => P
    [orderr] => 47
    [journal_id] => 1
    [googlesearch_link] => 
    [edit_on] => 
    [is_status] => 1
    [journalname] => EPRA International Journal of Multidisciplinary Research (IJMR)
    [short_code] => IJMR
    [eissn] =>  2455-3662 (Online)
    [pissn] => - --
    [home_page_wrapper] => images/products_image/11.IJMR.png
)
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